Efficient March test algorithm for 1T1R cross‐bar with complete fault coverage

Author:

Liu Peng1,You Zhiqiang1,Kuang Jishun1,Hu Zhipeng1,Duan Heng2,Wang Weizheng3

Affiliation:

1. Key Laboratory for Embedded and Network Computing of Hunan Province, College of Computer Science and Electronic EngineeringHunan UniversityChangsha410082People's Republic of China

2. College of Electrical and Information EngineeringHunan Institute of TechnologyChangshaPeople's Republic of China

3. College of Computer and Communication EngineeringChangsha University of Science and TechnologyChangshaPeople's Republic of China

Funder

National Natural Science Foundation of China

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

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