Sneak-Path Testing of Crossbar-Based Nonvolatile Random Access Memories-Reference-Cited by-同舟云学术

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Sneak-Path Testing of Crossbar-Based Nonvolatile Random Access Memories

Published:2013-05 Issue:3 Volume:12 Page:413-426
ISSN:1536-125X
Container-title:IEEE Transactions on Nanotechnology
language:
Short-container-title:IEEE Trans. Nanotechnology

Author:

Kannan Sachhidh,Rajendran Jeyavijayan,Karri Ramesh,Sinanoglu Ozgur

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications

Link

http://xplorestaging.ieee.org/ielx7/7729/6514078/06482250.pdf?arnumber=6482250

Cited by 85 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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4. Drop-Connect as a Fault-Tolerance Approach for RRAM-based Deep Neural Network Accelerators;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22

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