A synergistic fault tolerance framework for Mbit 28nm embedded RRAM
Author:
Affiliation:
1. Univ. Grenoble Alpes, CEA, Leti,Grenoble,France,F-38000
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx8/10616000/10616049/10616063.pdf?arnumber=10616063
Reference21 articles.
1. Reliability of 28nm embedded RRAM for consumer and industrial products
2. Resolving Endurance and Program Time Trade-Off of 40nm TaOx-Based ReRAM by Co-Optimizing Verify Cycles, Reset Voltage and ECC Strength
3. 28nm Data Memory with Embedded RRAM Technology in Automotive Microcontrollers
4. Demonstration of High Endurance Capability on Mega-Bit RRAM Macro and Model of ppm Level Failures
5. Error correction improvement based on weak-bit-flipping for resistive memories
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