Reliability of 28nm embedded RRAM for consumer and industrial products
Author:
Affiliation:
1. Infineon Technologies AG,Neubiberg,Germany,85579
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9779263/9779243/09779300.pdf?arnumber=9779300
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1. Analytical Percolation Model for Predicting Anomalous Charge Loss in Flash Memories
2. Design Challenged and Solutions of Emerging Nonvolatile Memory for Embedded Applications;chih;IEDM,0
3. Industrially Applicable Read Disturb Model and Performance on MegaBit 28nm Embedded RRAM;yang;VLSI,2020
4. Review and Outlook on Embedded NVM Technologies – From Evolution to Revolution
5. A 5ns Fast Write Multi-Level Non-Volatile 1 K bits RRAM Memory with Advance Write Scheme;sheu;VLSI,2009
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