Performance and Reliability of Technology Qualified 34 Mb Split-Gate eFLASH Macro in 28 nm HKMG-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Performance and Reliability of Technology Qualified 34 Mb Split-Gate eFLASH Macro in 28 nm HKMG

Published:2024-05-12 Issue: Volume: Page:1-4
ISSN:
Container-title:2024 IEEE International Memory Workshop (IMW)
language:
Short-container-title:

Author:

Richter Ralf¹,Dünkel Stefan¹,Müller Bert¹,Mauersberger Frank¹,Wittek Sven¹,Beyer Sven¹,Böhme Jana¹,Ritter Uwe¹,Sessi Violetta¹,Xu Zhen¹,Drescher Maximilian¹,Kim Jinho²,Ghazavi Parviz²,Tkachev Yuri²,Tee Latt²,Li Zonglin²,Tadayoni Mandana²,Luo Fan²,Do Nhan²,Jourba Serguei³,Decobert Catherine³,Festes Gilles³,Villard Bruno³,Pate-Cazal Thibaut³

Affiliation:

1. GlobalFoundries Module One LLC &Co. KG,Dresden,Germany

2. Silicon Storage Technology, Inc., a Subsidiary of Microchip Technology, Inc.,San Jose,CA,U.S.A.,95134

3. Silicon Storage Technology, Inc., a Subsidiary of Microchip Technology, Inc.,Rousset,France,13790

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10536936/10536916/10536960.pdf?arnumber=10536960

Reference6 articles.

1. Split-Gate Floating Poly SuperFlash® Memory Technology, Design, and Reliability

2. 40nm Embedded Self-Aligned Split-Gate Flash Technology for High-Density Automotive Microcontrollers

3. A cost-efficient 28nm split-gate eFLASH memory featuring a HKMG hybrid bit cell and HV device

4. Performance and Reliability of 4 Mb eFLASH Memory Array Featuring 28 nm Split-Gate Cell with HKMG Select Transistor

5. Reliability of 28nm embedded RRAM for consumer and industrial products

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP