Author:
Hayakawa Atsuna,Maeda Kazuki,Fukuyama Shouhei,Takishita Hirofumi,Yasuhara Ryutaro,Mishima Satoshi,Takeuchi Ken
Cited by
2 articles.
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1. A synergistic fault tolerance framework for Mbit 28nm embedded RRAM;2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS);2024-07-03
2. Memory Challenges;Springer Handbook of Semiconductor Devices;2022-11-11