Online Fault Detection and Diagnosis in RRAM
Author:
Affiliation:
1. Delft University of Technology,Computer Engineering Department,Delft,The Netherlands
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10173930/10173940/10174113.pdf?arnumber=10174113
Reference27 articles.
1. Accelerating RRAM Testing with a Low-cost Computation-in-Memory based DFT
2. Evolution of the conductive filament system in HfO2-based memristors observed by direct atomic-scale imaging
3. The Role of Ti Capping Layer in HfOx-Based RRAM Devices
4. Validating a DFT Strategy’s Detection Capability regarding Emerging Faults in RRAMs;copetti;2021 IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC),2021
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A synergistic fault tolerance framework for Mbit 28nm embedded RRAM;2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS);2024-07-03
2. Lifecycle Management of Emerging Memories;2024 IEEE European Test Symposium (ETS);2024-05-20
3. Online Detection of Unique Faults in RRAMs;2024 IEEE European Test Symposium (ETS);2024-05-20
4. A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing;Journal of Electronic Testing;2024-03-23
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3