An Analysis of Fault Diagnosis Approaches in Memristor Crossbar Array-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

An Analysis of Fault Diagnosis Approaches in Memristor Crossbar Array

Published:2023-12-18 Issue: Volume:17 Page:242-247
ISSN:
Container-title:2023 IEEE International Symposium on Smart Electronic Systems (iSES)
language:
Short-container-title:

Author:

Yadav Dev Narayan¹,Thangkhiew Phrangboklang Lyngton²,Sengupta Indranil³

Affiliation:

1. Center for Artificial Intelligence and Machine Learning, Siksha ‘O’, Anusandhan,Bhubaneswar,India

2. Indian Institute of Information Technology,Department of Computer Science and Engineering,Guwahati,India

3. Indian Institute of Technology,Department of Computer Science and Engineering,Kharagpur,India

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10467041/10466793/10467076.pdf?arnumber=10467076

Reference38 articles.

1. NVSim: A Circuit-Level Performance, Energy, and Area Model for Emerging Non-volatile Memory

2. RRAM Defect Modeling and Failure Analysis Based on March Test and a Novel Squeeze-Search Scheme

3. Analyzing Fault Tolerance Behaviour in Memristor-based Crossbar for Neuromorphic Applications

4. Feed-Forward learning algorithm for resistive memories

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP