Evidence of 1000 eV positive oxygen ion flux generated in reactive HiPIMS plasma

Abstract

Abstract The arrival of highly energetic (near 1000 eV) positive atomic oxygen ions at the substrate region has been detected in a unipolar reactive high-power impulse magnetron sputtering process operated with an uncooled copper target in argon–oxygen mixtures. Examination of the ion fluxes from discharge plasma was performed with a magnetic sector mass-spectrometer and an electrostatic energy analyzer. The energy of fast positive O+ ions is close to the value of eV d (e—elementary charge, V d—discharge voltage), which indicates their connection to the well-studied fraction of negative O− ions, which undergo acceleration in the cathode sheath. After switching the oxygen gas supply off, the flux of energetic O+ species decreases gradually as the poisoned target surface layers become depleted of oxygen due to sputtering in pure argon. Presumably, the observed energetic O+ ions originate as a result of low-angle scattering of fast negative O− ions from other charged or neutral species in the plasma followed by electron detachment, ionization, or charge exchange.