Hybrid Organic/Inorganic Materials Depth Profiling Using Low Energy Cesium Ions
Author:
Affiliation:
1. Research Centre in Physics of Matter and Radiation, University of Namur, Namur, Belgium
Publisher
American Chemical Society (ACS)
Subject
Spectroscopy,Structural Biology
Link
http://link.springer.com/content/pdf/10.1007/s13361-016-1353-9.pdf
Reference29 articles.
1. Depth Resolution During C60+ Profiling of Multilayer Molecular Films
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3. Molecular Depth Profiling with Argon Gas Cluster Ion Beams
4. Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry
5. A C60 Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics
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