Hybrid Organic/Inorganic Materials Depth Profiling Using Low Energy Cesium Ions
Author:
Affiliation:
1. Research Centre in Physics of Matter and Radiation, University of Namur, Namur, Belgium
Publisher
American Chemical Society (ACS)
Subject
Spectroscopy,Structural Biology
Link
http://link.springer.com/content/pdf/10.1007/s13361-016-1353-9.pdf
Reference29 articles.
1. Depth Resolution During C60+ Profiling of Multilayer Molecular Films
2. Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams
3. Molecular Depth Profiling with Argon Gas Cluster Ion Beams
4. Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry
5. A C60 Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics
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