Depth Resolution During C60+ Profiling of Multilayer Molecular Films-Reference-Cited by-同舟云学术

Depth Resolution During C60+ Profiling of Multilayer Molecular Films

Published:2008-09-06 Issue:19 Volume:80 Page:7363-7371
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Zheng Leiliang¹,Wucher Andreas¹,Winograd Nicholas¹

Affiliation:

1. Department of Chemistry, The Pennsylvania State University, 104 Chemistry Building, University Park, Pennsylvania 16802, and Physics Department, University of Duisburg—Essen, Duisburg, 47048 Germany

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac801056f

Reference42 articles.

1. Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry

2. Depth Profiling of 4-Acetamindophenol-Doped Poly(lactic acid) Films Using Cluster Secondary Ion Mass Spectrometry

3. Depth Profiling of Peptide Films with TOF-SIMS and a C60 Probe

4. Depth Profiling of Langmuir−Blodgett Films with a Buckminsterfullerene Probe

5. Depth profiling studies of multilayer films with a C60+ ion source

Cited by 49 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Dendrite Formation on the Poly(methyl methacrylate) Surface Reactively Sputtered with a Cesium Ion Beam;The Journal of Physical Chemistry B;2022-12-23

2. Experimental determination of Li diffusivity in LLZO using isotopic exchange and FIB-SIMS;Journal of Physics: Energy;2021-03-19

3. Quantitative calibration of conductive pattern growth via electroless copper plating at nano-resolution;Surface Topography: Metrology and Properties;2020-07-13

4. High resolution mass spectrometry for single cell analysis;International Journal of Mass Spectrometry;2020-04

5. Self-assembled monolayers of octadecylphosphonic acid and polymer films: Surface chemistry and chemical structures studied by time-of-flight secondary ion mass spectrometry;Surface and Interface Analysis;2017-09-15