Study of Read Recovery Dynamic Faults in 6T SRAMS and Method to Improve Test Time
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-010-5176-5.pdf
Reference20 articles.
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4. Dilillo L, Al-Hashimi BM (2007) March CRF: an efficient test for complex read faults in SRAM memories. Design and diagnostics of electronic circuits and systems, 2007. DDECS ′07. IEEE, pp 1–6, 11–13 April
5. Dilillo L, Girard P, Pravossoudovitch S, Virazel A, Bastian M (2005) Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 μm and 90 nm technologies. Design automation conference, 2005. Proceedings. 42nd, pp 857–862, 13–17 June
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