Author:
Dilillo Luigi,Al-Hashimi Bashir M.
Cited by
3 articles.
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1. Study of Read Recovery Dynamic Faults in 6T SRAMS and Method to Improve Test Time;Journal of Electronic Testing;2010-11-06
2. Models in Memory Testing;Models in Hardware Testing;2009-10-27
3. Memory Testing and Self-Repair;Design and Test Technology for Dependable Systems-on-Chip