Multi-Objective Optimization to Improve Both Thermal and Device Performance of a Nonuniformly Powered Micro-Architecture

Author:

Karajgikar Saket1,Agonafer Dereje1,Ghose Kanad2,Sammakia Bahgat2,Amon Cristina3,Refai-Ahmed Gamal4

Affiliation:

1. University of Texas at Arlington, Arlington, TX 76019

2. SUNY Binghamton, Binghamton, NY 13902

3. University of Toronto, Toronto, ON, M5S3G8, Canada

4. Advanced Micro Devices, Inc., Markham, ON, L3t 7X6, Canada

Abstract

Integration of different functional components such as level two (L2) cache memory, high-speed I/O interfaces, and memory controller has enhanced microprocessor performance. In this architecture, certain functional units on the microprocessor dissipate a significant fraction of the total power while other functional units dissipate little or no power. This highly nonuniform power distribution results in a large temperature gradient with localized hot spots that may have detrimental effects on computer performance, product reliability, and yield. Moving the functional units may reduce the junction temperature but can affect performance by a factor as much as 30%. In this paper, a multi-objective optimization is performed to minimize the junction temperature without significantly altering the computer performance. The analysis was performed for 90 nm Pentium IV Northwood architecture operating at 3 GHz clock speed. Each functional unit on the die has a specific role, so functional units with similar roles were grouped together. Thus, the actual Pentium IV die was divided into four groups (front end, execution cores, bus and L2, and out-of-order engine). Repositioning constraints were determined using circuit delay models of major functional units in a micro-architectural simulator. Thus, depending on the scenario, relocating functional units can result in virtually no performance loss (less than 2% is assumed to be minimal and is reported as 0%) to as much as 30% performance loss. From the results, the minimum and the maximum temperatures were 56.6°C and 62.2°C. This ΔT corresponds to thermal design power of 60.2 W. For microprocessors with higher thermal design power (115 W) and operating at higher clock speed, higher ΔT can be realized. Based on this paper’s analysis, the optimized scenario resulted in a junction temperature of 56.6°C at the cost of a 14% performance loss.

Publisher

ASME International

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials

Reference23 articles.

1. Design Challenges of Technology Scaling;Borkar;IEEE MICRO

2. Thermal Management of CPUs: A Perspective on Trends, Needs and Opportunities;Mahajan

3. 2005, International Technology Roadmap for Semiconductors.

4. Cooling a Microprocessor Chip;Mahajan;Proc. IEEE

5. Fast Placement-Dependent Full Chip Thermal Simulation;Zhiping

Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3