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Optimizing MOS transistor mismatch

Published:1998 Issue:1 Volume:33 Page:147-150
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:
Short-container-title:IEEE J. Solid-State Circuits

Author:

Lovett S.J.,Welten M.,Mathewson A.,Mason B.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx3/4/14258/00654947.pdf?arnumber=654947

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