Efficient Statistical Parameter Extraction for Modeling MOSFET Mismatch-Reference-Cited by-同舟云学术

Efficient Statistical Parameter Extraction for Modeling MOSFET Mismatch

Published:2023-05 Issue:5 Volume:42 Page:1618-1622
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Wu Kun¹,Guo Nanlin²^ORCID,Li Fei³,Zhu Nengyong³,Tao Jun²^ORCID,Li Xin⁴

Affiliation:

1. School of Electronic Information, Wuhan University, Wuhan, China

2. State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China

3. Empyrean Technology Company Ltd., Beijing, China

4. Data Science Research Center, Duke Kunshan University, Kunshan, China

Funder

National Key Research and Development Program of China

National Natural Science Foundation of China (NSFC) Research Projects

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

Reference16 articles.

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