Cross-Layer Modeling and Simulation of Circuit Reliability-Reference-Cited by-同舟云学术

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Cross-Layer Modeling and Simulation of Circuit Reliability

Published:2014-01 Issue:1 Volume:33 Page:8-23
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Cao Yu,Velamala Jyothi,Sutaria Ketul,Chen Mike Shuo-Wei,Ahlbin Jonathan,Esqueda Ivan Sanchez,Bajura Michael,Fritze Michael

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx7/43/6685848/06685855.pdf?arnumber=6685855

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