Resiliency in Digital Processing Systems

Author:

Krstić M.1,Andjelković M.1,Chen J.1,Lu L.1,Veronesi A.1,Ulbricht M.1

Affiliation:

1. IHP – Leibniz-Institute für Innovative Mikroelektronik,Frankfurt (Oder),Germany

Funder

Ministry of Education

Publisher

IEEE

Reference49 articles.

1. Analyzing the Impact of SEUs on SRAMs with Resistive-Bridge Defects;cardoso madeiros;Proc International Conference on VLSI Design,2016

2. RT Level timing Modeling for Aging Prediction”, in Proc;koppaetzky;Design Automation & Test in Europe Conference & Exhibition (DATE),2016

3. A register-transfer-level fault simulator for permanent and transient faults in embedded processors

4. Fault Injection into VHDL Models: the MEFISTO Tool;jenn;Predictably Dependable Computing Systems,2015

5. SEU and SET fault injection models for fault tolerant circuits

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