Funder
European Regional Development Fund
European Commission
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Reference34 articles.
1. Integral impact of BTI, PVT variation, and workload on SRAM sense amplifier;Agbo;IEEE Trans. on VLSI Systems,2017
2. Effect of BTI degradation on transistor variability in advanced semiconductor technologies;Pae;IEEE Trans. Device Mater. Reliab.,2008
3. Hot carrier injection degradation induced dispersion: model and circuit-level measurement;Cacho;IEEE Int. Integr. Reliab. Workshop,2011
4. Impact and mitigation of sense amplifier aging degradation using realistic workloads;Kraak;IEEE Trans. on VLSI Systems,2017
5. Mitigation of sense amplifier degradation using input switching;Kraak,2017