A novel carrier accumulating structure for 1200V IGBTs without negative capacitance and decreasing breakdown-voltage

Author:

Rahman Md Tasbir,Kimura Keisuke,Fukami Takeshi,Konishi Masaki,Nishiwaki Tsuyoshi,Saito Jun,Hamada Kimimori

Publisher

IEEE

Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Optimized Trench IGBT With Dummy Gate and Buried n-Type CS Layer for Substantial Reduction of Power Loss and EMI Noise;IEEE Transactions on Electron Devices;2024

2. Device Design Direction of CSTBT for Low Loss and EMI Noise;IEEE Transactions on Electron Devices;2023-12

3. Novel Diode Structure for Ultra-Law-Loss RC-IGBTs;2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD);2023-05-28

4. A Novel IGBT with Variable Conductance Path Realizing Both Low $V_{on}$ and Turn-off Loss;2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD);2023-05-28

5. Design of 1200-V RC-IGBT for TOYOTA's 5th generation HEV/PHEV systems;2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD);2023-05-28

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