A Low Area On-chip Delay Measurement System Using Embedded Delay Measurement Circuit-Reference-Cited by-同舟云学术

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A Low Area On-chip Delay Measurement System Using Embedded Delay Measurement Circuit

Published:2010-12 Issue: Volume: Page:
ISSN:
Container-title:2010 19th IEEE Asian Test Symposium
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Author:

Katoh Kentaroh,Namba Kazuteru,Ito Hideo

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5689827/5692210/05692270.pdf?arnumber=5692270

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Real Circuit Delay Measurement Method by Variable Frequency Operation with On-Chip Fine Resolution Oscillator;IPSJ Transactions on System LSI Design Methodology;2020

2. A Calibration Technique for DVMC with Delay Time Controllable Inverter;IPSJ Transactions on System LSI Design Methodology;2016

3. A High Resolution On-Chip Delay Sensor with Low Supply-Voltage Sensitivity for High-Performance Electronic Systems;Sensors;2015-02-13

4. A Small Chip Area Stochastic Calibration for TDC Using Ring Oscillator;Journal of Electronic Testing;2014-11-05

5. Improving Small-Delay Fault Coverage of On-Chip Delay Measurement by Segmented Scan and Test Point Insertion;IEICE Transactions on Information and Systems;2014

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