Accuracy Analysis of Calorimetric Loss Measurement for Benchmarking Wide Bandgap Power Transistors under Soft-Switching Operation-Reference-Cited by-同舟云学术

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Accuracy Analysis of Calorimetric Loss Measurement for Benchmarking Wide Bandgap Power Transistors under Soft-Switching Operation

Published:2019-05 Issue: Volume: Page:
ISSN:
Container-title:2019 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia)
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Author:

Koch Dominik,Araujo Samuel,Kallfass Ingmar

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8755810/8760305/08760332.pdf?arnumber=8760332

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Estimation of Semiconductor Power Losses Through Automatic Thermal Modeling;IEEE Transactions on Power Electronics;2024-09

2. A New Calorimetric Method for Switching Loss Measurement of Power Devices;2024 IEEE Applied Power Electronics Conference and Exposition (APEC);2024-02-25

3. Gate-Source-Dependent Soft- and Hard-Switching Losses of 1200V SiC MOSFETs Utilizing Heatsinkless Calorimetric Measurements Based on Optical Sensors;2024 IEEE Applied Power Electronics Conference and Exposition (APEC);2024-02-25

4. Loss Measurement of Low R_DS Devices Through Thermal Modelling - The Advantage of Not Turning it Fully On;2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe);2023-09-04

5. Thermal Impedance Calibration for Rapid and Noninvasive Calorimetric Soft-Switching Loss Characterization;IEEE Transactions on Power Electronics;2023-07

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