Estimation of Semiconductor Power Losses Through Automatic Thermal Modeling-Reference-Cited by-同舟云学术

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Estimation of Semiconductor Power Losses Through Automatic Thermal Modeling

Published:2024-09 Issue:9 Volume:39 Page:11086-11098
ISSN:0885-8993
Container-title:IEEE Transactions on Power Electronics
language:
Short-container-title:IEEE Trans. Power Electron.

Author:

Sanz-Alcaine José Miguel¹^ORCID,Sebastián Eduardo²^ORCID,Perez-Cebolla Francisco José¹^ORCID,Arruti Asier³^ORCID,Bernal-Ruiz Carlos¹^ORCID,Aizpuru Iosu³^ORCID

Affiliation:

1. Group of Power Electronics and Microelectronics (GEPM) Research Group, Aragón Institute of Engineering Research, University of Zaragoza, Zaragoza, Spain

2. Robotics, Computer Vision and Artificial Intelligence (RoPeRT) Research Group, Aragón Institute of Engineering Research, University of Zaragoza, Zaragoza, Spain

3. Department of Electronics and Computing, Faculty of Engineering, Mondragon Unibertsitatea, Arrasate, Spain

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx8/63/10599943/10552431.pdf?arnumber=10552431

Reference59 articles.

1. Review and Outlook on GaN and SiC Power Devices: Industrial State-of-the-Art, Applications, and Perspectives

2. Review of Commercial GaN Power Devices and GaN-Based Converter Design Challenges

3. On the Transient Thermal Characteristics of Silicon Carbide Power Electronics Modules

4. Experimental Characterization of Silicon and Gallium Nitride 200 V Power Semiconductors for Modular/Multi-Level Converters Using Advanced Measurement Techniques

5. Suitability of Current Sensors for the Measurement of Switching Currents in Power Semiconductors

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