Thermal Impedance Calibration for Rapid and Noninvasive Calorimetric Soft-Switching Loss Characterization
Author:
Affiliation:
1. Institute of Robust Power Semiconductor Systems, University of Stuttgart, Stuttgart, Germany
Funder
WIPANO project MessLeha through the German Federal Ministry for Economic Affairs and Energy and Project Management Jülich
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/63/10130046/10103650.pdf?arnumber=10103650
Reference47 articles.
1. A New Method of Switching Loss Evaluation for GaN HEMTs in Half-Bridge Configuration
2. Soft-Switching Losses in GaN and SiC Power Transistors Based on New Calorimetric Measurements
3. Switching loss characterization of wide band-gap devices by an indirect identification methodology;keuck;Proc 20th Eur Conf Power Electron Appl,0
4. A Comparative Study of Loss Measurement Techniques for SiC MOSFET Based PE Converters
5. Evaluation of GaN transistor losses at MHz frequencies in soft switching converters
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