Transistor Self-Heating-Aware Synthesis for Reliable Digital Circuit Designs-Reference-Cited by-同舟云学术

Transistor Self-Heating-Aware Synthesis for Reliable Digital Circuit Designs

Published:2023-12 Issue:12 Volume:70 Page:5366-5379
ISSN:1549-8328
Container-title:IEEE Transactions on Circuits and Systems I: Regular Papers
language:
Short-container-title:IEEE Trans. Circuits Syst. I

Author:

Klemme Florian¹^ORCID,Amrouch Hussam¹^ORCID

Affiliation:

1. Semiconductor Test and Reliability (STAR), Faculty of Computer Science, Electrical Engineering and Information Technology, University of Stuttgart, Stuttgart, Germany

Funder

Advantest as part of the Graduate School “Intelligent Methods for Test and Reliability” (GS-IMTR), University of Stuttgart

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture

Link

http://xplorestaging.ieee.org/ielx7/8919/10363413/10264118.pdf?arnumber=10264118

Reference18 articles.

1. Impact of Self-Heating Effect on Transistor Characterization and Reliability Issues in Sub-10 nm Technology Nodes

2. Transistor Self-Heating: The Rising Challenge for Semiconductor Testing

3. Self-heating effect in FinFETs and its impact on devices reliability characterization

4. Upheaving Self-Heating Effects from Transistor to Circuit Level using Conventional EDA Tool Flows

5. The EPFL combinational benchmark suite;Amarú P.-E. Gaillardon

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