Impact of Self-Heating in 5nm FinFETs at Cryogenic Temperatures for Reliable Quantum Computing: Device-Circuit Interaction-Reference-Cited by-同舟云学术

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Impact of Self-Heating in 5nm FinFETs at Cryogenic Temperatures for Reliable Quantum Computing: Device-Circuit Interaction

Published:2024-04-14 Issue: Volume:192 Page:1-7
ISSN:
Container-title:2024 IEEE International Reliability Physics Symposium (IRPS)
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Author:

Parihar Shivendra Singh¹,Pahwa Girish²,Chauhan Yogesh S.³,Amrouch Hussam⁴

Affiliation:

1. University of Stuttgart,Semiconductor Test and Reliability,Germany

2. University of California Berkeley,Berkeley,USA

3. Indian Institute of Technology,Kanpur,India

4. Munich Institute of Robotics and Machine Intelligence, Technical University of Munich,Chair of AI Processor Design,Munich,Germany

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10529283/10529298/10529431.pdf?arnumber=10529431

Reference34 articles.

1. Cryo-CMOS Circuits and Systems for Quantum Computing Applications

2. 29.1 A 28nm Bulk-CMOS 4-to-8GHz ¡2mW Cryogenic Pulse Modulator for Scalable Quantum Computing

3. Cryo-CMOS Interfaces for Large-Scale Quantum Computers

4. Cryo-CMOS for quantum computing

5. Cryo-CMOS for Analog/Mixed-Signal Circuits and Systems

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