Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
46 articles.
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1. Diagnosis of Double Faults Consisting of a Stuck-at Fault and a Transition Fault;2024 International Technical Conference on Circuits/Systems, Computers, and Communications (ITC-CSCC);2024-07-02
2. Introduction;Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design;2023
3. Scan-Based Test Chip Design with XOR-based C-testable Functional Blocks;2022 IEEE International Test Conference (ITC);2022-09
4. A comprehensive framework for cell-aware diagnosis of customer returns;Microelectronics Reliability;2022-08
5. Improving Volume Diagnosis and Debug with Test Failure Clustering and Reorganization;2021 IEEE International Test Conference (ITC);2021-10