Diagnosis of Double Faults Consisting of a Stuck-at Fault and a Transition Fault
Author:
Affiliation:
1. Graduate School of Sci. and Eng. Ehime University,Matsuyama,Japan
2. University of Wisconsin - Madison,Dept. of Electrical and Computer Eng.,Madison,U.S.A
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx8/10628105/10628121/10628279.pdf?arnumber=10628279
Reference15 articles.
1. A method of fault analysis for test generation and fault diagnosis
2. POIROT: A Logic Fault Diagno-sis Tool and Its Applications;Venkataraman,2000
3. On diagnosing multiple stuck-at faults using multiple and single fault simulation in combinational circuits
4. Analysis and methodology for multiple-fault diagnosis
5. Multiple-Fault Diagnosis Using Faulty-Region Identification
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