Introduction
Author:
Publisher
Springer Nature Singapore
Link
https://link.springer.com/content/pdf/10.1007/978-981-19-8551-5_1
Reference81 articles.
1. Transistor count in electronic devices, May 2022. https://en.wikipedia.org/wiki/Transistor_count.
2. Amit Agarwal, Bipul Chandra Paul, Hamid Mahmoodi, Animesh Datta, and Kaushik Roy. A process-tolerant cache architecture for improved yield in nanoscale technologies. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 13(1):27–38, 2005.
3. Aditya Agrawal, Amin Ansari, and Josep Torrellas. Mosaic: Exploiting the spatial locality of process variation to reduce refresh energy in on-chip eDRAM modules. In 2014 IEEE 20th International Symposium on High Performance Computer Architecture (HPCA), pages 84–95. IEEE, 2014.
4. Rob Aitken. Yield Learning Perspectives. IEEE Design & Test of Computers, 29(1):59–62, 2012.
5. Bijan Alizadeh and Masahiro Fujita. A debugging method for repairing post-silicon bugs of high performance processors in the fields. In 2010 International Conference on Field-Programmable Technology, pages 328–331, 2010.
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