A comprehensive framework for cell-aware diagnosis of customer returns-Reference-Cited by-同舟云学术

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A comprehensive framework for cell-aware diagnosis of customer returns

Published:2022-08 Issue: Volume:135 Page:114595
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

d'Hondt P.,Mhamdi S.,Girard P.,Virazel A.,Ladhar A.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference37 articles.

1. Cell-aware test;Hapke;IEEE Trans. Comput.-Aided Des.,2014

2. IC test solutions for the automotive market;Pateras,2017

3. Cell-aware diagnosis: defective inmates exposed in their cells;Maxwell,2016

4. Multivariate outlier modeling for capturing customer returns – how simple it can be;Tikkanen,2014

5. Efficient and accurate method for intra-gate defect diagnoses in nanometer technology;Ladhar,2009

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Defect Diagnosis Techniques for Silicon Customer Returns;Frontiers of Quality Electronic Design (QED);2023

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