Cell-Aware Test-Reference-Cited by-同舟云学术

Cell-Aware Test

Published:2014-09 Issue:9 Volume:33 Page:1396-1409
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Hapke Friedrich,Redemund Wilfried,Glowatz Andreas,Rajski Janusz,Reese Michael,Hustava Marek,Keim Martin,Schloeffel Juergen,Fast Anja

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

Cited by 94 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

2. Optimized Timing Aware ATPG for At-Speed Test of Cell Internal Faults;2024 IEEE 8th International Test Conference India (ITC India);2024-07-21

3. Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects;2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS);2024-07-03

5. Bit-Complemented Test Data to Replace the Tail of a Fault Coverage Curve;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2024-04