Radiation Tolerant Multi-Bit Flip-Flop System With Embedded Timing Pre-Error Sensing
Author:
Affiliation:
1. STMicroelectronics Private Ltd., Greater Noida, India
2. STMicroelectronics S.r.l, Milan, Italy
3. Department of Information Engineering, University of Padua, Padova, Italy
Funder
STMicroelectronics Private Ltd
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/4/9866858/09718587.pdf?arnumber=9718587
Reference32 articles.
1. Frequency Dependence of Alpha-Particle Induced Soft Error Rates of Flip-Flops in 40-nm CMOS Technology
2. A Quatro-Based 65-nm Flip-Flop Circuit for Soft-Error Resilience
3. Single Phase Clock Based Radiation Tolerant D Flip-flop Circuit
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