Frequency Dependence of Alpha-Particle Induced Soft Error Rates of Flip-Flops in 40-nm CMOS Technology-Reference-Cited by-同舟云学术

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Frequency Dependence of Alpha-Particle Induced Soft Error Rates of Flip-Flops in 40-nm CMOS Technology

Published:2012-12 Issue:6 Volume:59 Page:2796-2802
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Jagannathan S.,Loveless T. D.,Bhuva B. L.,Gaspard N. J.,Mahatme N.,Assis T.,Wen S.-J,Wong R.,Massengill L. W.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/6365378/06361437.pdf?arnumber=6361437

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