Soft error mechanism in SOI D flip-flop induced by space electrostatic discharge

Author:

Yuan Run-Jie,Chen Rui,Han Jian-Wei,Wang Xuan,Chen Qian,Liang Ya-Nan,Zhou Jie

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference27 articles.

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4. A brief review of ground and flight failures of Chinese spacecraft;Ji;Prog. Aerosp. Sci.,2019

5. Anomalies of the ADSP 21060 onboard the DEMETER satellite;Inguimbert;IEEE Trans. Nucl. Sci.,2013

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