PSI Design Solutions for High Speed Die-to-Die Interface in Chiplet Applications

Author:

Kim Taeyun1,Moon Sungwook1,Jo Chanmin1,Nam Seungki1,Lee Yongho1

Affiliation:

1. Samsung Electronics Co. Ltd.,Foundry Business Division,Hwaseong-si,South Korea

Publisher

IEEE

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Modeling and Analysis of Heterogeneously Integrated Chiplet-to-Chiplet Communication Link in 2.5D Advanced Packaging;2024 IEEE 74th Electronic Components and Technology Conference (ECTC);2024-05-28

2. Signal Integrity Design and Analysis of Universal Chiplet Interconnect Express (UCIe) Channel in Silicon Interposer for Advanced Package;2023 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS);2023-12-12

3. Exploiting signal skew to reduce delay uncertainty for chiplet interconnects;IEICE Electronics Express;2023-07-10

4. Optimal Channel Design for Die-to-Die Interface in Multi-die Integration Applications;2023 IEEE 73rd Electronic Components and Technology Conference (ECTC);2023-05

5. Chip Partition Heterogeneous Integration and Chip Split Heterogeneous Integration;Chiplet Design and Heterogeneous Integration Packaging;2023

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