AlGaN/GaN-Based Multimetal Gated High-Electron-Mobility Transistor With Improved Linearity

Author:

Azad Md. Tasnim1ORCID,Hossain Toiyob1ORCID,Sikder Bejoy1ORCID,Xie Qingyun2ORCID,Yuan Mengyang2ORCID,Yagyu Eiji3,Teo Koon Hoo4,Palacios Tomás2ORCID,Chowdhury Nadim1ORCID

Affiliation:

1. Department of Electrical and Electronic Engineering, Bangladesh University of Engineering and Technology, Dhaka, Bangladesh

2. Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, MA, USA

3. Advanced Technology Research and Development Center, Mitsubishi Electric Corporation, Amagasaki, Japan

4. Mitsubishi Electric Research Laboratories, Cambridge, MA, USA

Funder

Bangladesh University of Engineering and Technology

Air Force Office of Scientific Research

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Measurement and Modeling of GaN HEMTs Operating at 500 °C;2024 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE);2024-08-06

2. High linearity AlGaN/GaN HEMTs with Au-free Ti/Al/Ni/Ti ohmic contacts for Ka-band applications;Applied Physics Express;2024-07-01

3. HEMT As a Potential Contender For 5th Generation Communication Technology;2024 International Conference on Integrated Circuits, Communication, and Computing Systems (ICIC3S);2024-06-08

4. Investigation of Traps Impact on PAE and Linearity of AlGaN/GaN HEMTs Relying on a Combined TCAD–Compact Model Approach;IEEE Transactions on Electron Devices;2024-06

5. Revolutionizing Fe doped back barrier AlGaN/GaN HEMTs: Unveiling the remarkable 1700V breakdown voltage milestone;Microelectronics Journal;2024-05

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