Single Event Upsets Under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static Mode-Reference-Cited by-同舟云学术

Single Event Upsets Under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static Mode

Published:2020-07 Issue:7 Volume:67 Page:1461-1469
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Fabero Juan Carlos^ORCID,Mecha Hortensia^ORCID,Franco Francisco J.^ORCID,Clemente Juan Antonio^ORCID,Korkian Golnaz^ORCID,Rey Solenne,Cheymol Benjamin,Baylac Maud^ORCID,Hubert Guillaume^ORCID,Velazco Raoul^ORCID

Funder

Secretara de Estado de Investigacin Desarrollo e Innovacin

Technological Research Institute Nanoelec

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx7/23/9142457/09020124.pdf?arnumber=9020124

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