Affiliation:
1. Beijing Microelectronics Technology Institute, Beijing 100076, China
2. China Academy of Aerospace Electronics Technology, Beijing 100094, China
Abstract
Aerospace-grade SRAM-based field-programmable gate arrays (FPGAs) used in space applications are highly susceptible to single event effects, leading to soft errors in FPGAs. Additionally, as FPGAs scale up, the difficulty of correcting soft errors also increases. This paper proposes that performing soft error sensitivity analysis on FPGAs can help target the more sensitive areas for detection and correction, thereby improving the efficiency of soft error repair. Firstly, in accordance with the dual-layer architecture of SRAM-based FPGAs, methods for the soft error sensitivity analysis of FPGA application layer resources and configuration bitstreams are reviewed. Subsequently, based on the analysis results, it also covers corresponding application layer memory scrubbing and configuration scrubbing techniques. A prospective look at emerging soft error mitigation technologies is discussed at the end of this review, supporting the development of highly reliable aerospace-grade SRAM-based FPGAs.
Reference85 articles.
1. Zhang, R.S. (2019). Research on Fault Injection and Scrubbing Technique for SRAM-Based FPGA. [Ph.D. Dissertation, Harbin Institute of Technology].
2. Nicolaidis, M. (2010). Soft Errors in Modern Electronic Systems, Springer Science & Business Media.
3. Petersen, E. (2011). Single Event Effects in Aerospace, John Wiley & Sons.
4. Lee, D.S., King, M., Evans, W., Cannon, M., Pérez-Celis, A., Anderson, J., Wirthlin, M., and Rice, W. (2018, January 16). Single-event characterization of 16 nm FinFET Xilinx UltraScale+ devices with heavy ion and neutron irradiation. Proceedings of the 2018 IEEE Radiation Effects Data Workshop (REDW), San Antonio, TX, USA.
5. Mitigation of radiation effects in SRAM-based FPGAs for space applications;Siegle;ACM Comput. Surv. (CSUR),2015