A 16-Gb T-Coil-Based GDDR6 DRAM With Merged-MUX TX, Optimized WCK Operation, and Alternative-Data-Bus Achieving 27-Gb/s/Pin in NRZ

Author:

Lee Daewoong1ORCID,Baek Jaehyeok1,Kwon Hye-Jung1,Kwon Dae-Hyun1,Cho Chulhee1ORCID,Kim Sang-Hoon1,An Donggun1ORCID,Chang Chulsoon2,Lim Unhak1,Im Jiyeon1,Sung Wonju1,Kim Hye-Ran1,Park Sun-Young1,Kim Hyoung-Joo1,Seol Hoseok1,Kim Juhwan1,Shin Jungbum1,Kang Gil-Young1,Kim Yong-Hun1,Kim Sooyoung1,Park Wansoo3,Kim Seok-Jung1,Lee Chan-Yong1,Lee Seungseob1,Park Tae-Hoon2,Oh Chi-Sung1ORCID,Ban Hyodong1,Ko Hyungjong1,Song Hoyoung1,Oh Tae-Young1,Hwang Sang-Joon1,Oh Kyung-Suk3,Choi Jung-Hwan1ORCID,Lee Jooyoung1

Affiliation:

1. Memory Division, Samsung Electronics, Hwaseong, South Korea

2. DRAM PIE1Group, Samsung Electronics, Hwaseong, South Korea

3. PKG Design Team, Samsung Electronics, Hwaseong, South Korea

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

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