Author:
Chaudhuri Arjun,Banerjee Sanmitra,Chakrabarty Krishnendu
Funder
National Science Foundation
Cited by
5 articles.
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1. Transferable Graph Neural Network-Based Delay-Fault Localization for Monolithic 3-D ICs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11
2. A Test Point Selection Method Based on Fault Response Matrices Framework;IEEE Transactions on Instrumentation and Measurement;2023
3. Graph Neural Network-based Delay-Fault Localization for Monolithic 3D ICs;2022 Design, Automation & Test in Europe Conference & Exhibition (DATE);2022-03-14
4. Graph Neural Network-based Delay-Fault Localization for Monolithic 3D ICs;2022 Design, Automation & Test in Europe Conference & Exhibition (DATE);2022-03-14
5. Testing and Fault-Localization Solutions for Monolithic 3D ICs;2021 IEEE International Test Conference in Asia (ITC-Asia);2021-08-18