A Test Point Selection Method Based on Fault Response Matrices Framework-Reference-Cited by-同舟云学术

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A Test Point Selection Method Based on Fault Response Matrices Framework

Published:2023 Issue: Volume:72 Page:1-12
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Hu Jing¹^ORCID,Lin Yuheng²^ORCID,Xu Zhongqiu¹^ORCID,He Hongxi¹^ORCID,Li Zhi¹^ORCID,Zhang Guoning¹^ORCID

Affiliation:

1. Electronic Engineering College, Heilongjiang University, Harbin, China

2. SWJTU-LEEDS Joint School, Southwest Jiaotong University, Chengdu, China

Funder

National Natural Science Foundation of China

Heilongjiang Provincial Key Laboratory of Micro-Nano Sensitive Devices and Systems

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/10012124/10113339.pdf?arnumber=10113339

Reference34 articles.

1. Test Point Insertion with Control Point by Greater Use of Existing Functional Flip-Flops

2. Test Point Insertion with Control Points Driven by Existing Functional Flip-Flops

3. Zero Cost Test Point Insertion Technique to Reduce Test Set Size and Test Generation Time for Structured ASICs

4. Low cost test point insertion without using extra registers for high performance design

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