Test Point Insertion with Control Points Driven by Existing Functional Flip-Flops-Reference-Cited by-同舟云学术

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Test Point Insertion with Control Points Driven by Existing Functional Flip-Flops

Published:2012-10 Issue:10 Volume:61 Page:1473-1483
ISSN:0018-9340
Container-title:IEEE Transactions on Computers
language:
Short-container-title:IEEE Trans. Comput.

Author:

Yang Joon-Sung,Touba Nur A.,Nadeau-Dostie Benoit

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software

Link

http://xplorestaging.ieee.org/ielx5/12/6280556/06035679.pdf?arnumber=6035679

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Test Point Selection Method Based on Fault Response Matrices Framework;IEEE Transactions on Instrumentation and Measurement;2023

2. SPAR: A New Test-Point Insertion Using Shared Points for Area Overhead Reduction;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022-11

3. DeepTPI: Test Point Insertion with Deep Reinforcement Learning;2022 IEEE International Test Conference (ITC);2022-09

4. Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs;Microprocessors and Microsystems;2020-09

5. A Flexible Scan-in Power Control Method in Logic BIST and Its Evaluation with TEG Chips;IEEE T EMERG TOP COM;2020

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