Benefits of Design Assist Techniques on Performances and Reliability of a RRAM Macro-Reference-Cited by-同舟云学术

Benefits of Design Assist Techniques on Performances and Reliability of a RRAM Macro

Published:2023-05 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE International Memory Workshop (IMW)
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Author:

Giraud B.¹,Ricavy S.²,Moursy Y.²,Laffond C.¹,Sever I.³,Gherman V.¹,Pezzin M.¹,Lepin F.¹,Diallo M.¹,Zenati K.¹,Dumas S.²,Vershkov M.³,Bricalli A.³,Piccolboni G.³,Noel J.-P.¹,Samir A.²,Pillonnet G.²,Thonnart Y.¹,Molas G.⁴

Affiliation:

1. Univ. Grenoble Alpes, CEA, List,Grenoble,France,F-38000

2. Univ. Grenoble Alpes, CEA, Leti,Grenoble,France,F-38000

3. Weebit Nano Ltd

4. Univ. Grenoble Alpes, CEA, Leti now Weebit Nano Ltd

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10145914/10145815/10145984.pdf?arnumber=10145984

Reference14 articles.

1. Reliability of 28nm embedded RRAM for consumer and industrial products

2. Infineon’s microcontrollers to go RRAM with TSMC;eenewseurope.com,2023

3. eMemory and UMC Bring New ReRAM Intellectual Property to Market;design-reuse.com,2023

4. Cell-to-Cell Fundamental Variability Limits Investigation in OxRRAM Arrays

5. Advances in Emerging Memory Technologies: From Data Storage to Artificial Intelligence

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1. Smart Write Algorithm to Enhance Performances and Reliability of an RRAM Macro;IEEE Journal of Solid-State Circuits;2024-09

2. A synergistic fault tolerance framework for Mbit 28nm embedded RRAM;2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS);2024-07-03

3. Sequential Decoders for Binary Linear Block ECCs;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22

4. Compute-In-Place Serial FeRAM: Enhancing Performance, Efficiency and Adaptability in Critical Embedded Systems;2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC);2023-10-16

5. RRAM Device Performances Under Capacitive-Enhanced Current Programming Scheme;IEEE Electron Device Letters;2023-07