An Atomistic Study on Hydrogenation Effects toward Quality Improvement of Program/Erase Cycle of MONOS-Type Memory-Reference-Cited by-同舟云学术

An Atomistic Study on Hydrogenation Effects toward Quality Improvement of Program/Erase Cycle of MONOS-Type Memory

Published:2011 Issue:5 Volume:E94-C Page:693-698
ISSN:0916-8524
Container-title:IEICE Transactions on Electronics
language:en
Short-container-title:IEICE Trans. Electron.

Author:

OTAKE Akira¹,YAMAGUCHI Keita¹,KAMIYA Katsumasa¹,SHIGETA Yasuteru²,SHIRAISHI Kenji¹³

Affiliation:

1. Graduate School of Pure and Applied Sciences, University of Tsukuba

2. Graduate School of Engineering Science, Osaka University

3. Center of Computational Science, University of Tsukuba

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://www.jstage.jst.go.jp/article/transele/E94.C/5/E94.C_5_693/_pdf

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