A new automatic method for testing interconnect resources in FPGAs based on general routing matrix-Reference-Cited by-同舟云学术

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A new automatic method for testing interconnect resources in FPGAs based on general routing matrix

Published:2015 Issue:20 Volume:12 Page:20150747-20150747
ISSN:1349-2543
Container-title:IEICE Electronics Express
language:en
Short-container-title:IEICE Electron. Express

Author:

Yang Zhen¹,Liang Chuanzeng¹,Wang Jian¹,Lai Jinmei¹

Affiliation:

1. ASIC and System State Key Laboratory, Fudan University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://www.jstage.jst.go.jp/article/elex/12/20/12_12.20150747/_pdf

Reference19 articles.

1. [1] P. H. W. Leong: Electronic Design, Test and Applications (2008) 137. DOI:10.1109/DELTA.2008.14

2. [2] Z. Marrakchi, H. Mrabet, U. Farooq and H. Mehrez: Int. J. Reconfigurable Comput. 2009 (2009) 6. DOI:10.1155/2009/259837

3. [3] A. Ruan, W. Tian, B. Ni and K. Wu: Integrated Circuits (2014) 111. DOI:10.1109/ISICIR.2014.7029438

4. [4] M. B. Tahoori and S. Mitra: IEEE Trans. Comput.-Aided Design Integr. Circuits Syst. 24 (2005) 1774. DOI:10.1109/TCAD.2005.852452

5. [5] M. B. Tahoori and S. Mitra: VLSI Test Symposium (2003) 134. DOI:10.1109/VTEST.2003.1197644

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1. Application dependent FPGA interconnect test method with small test configuration number using SMT net-grouping constraints;IEICE Electronics Express;2024

2. Connection Resource Testing Technology on FPGA Based on SOC core;2021 IEEE 15th International Conference on Electronic Measurement & Instruments (ICEMI);2021-10-29

3. Research on Hex Programmable Interconnect Points Test in Island-Style FPGA;Electronics;2020-12-18

4. An Integrated Framework for Application Independent Testing of FPGA Interconnect;Journal of Electronic Testing;2019-10

5. Application-Dependent Testing of FPGA Interconnect Network;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2019-10

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