Connection Resource Testing Technology on FPGA Based on SOC core-Reference-Cited by-同舟云学术

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Connection Resource Testing Technology on FPGA Based on SOC core

Published:2021-10-29 Issue: Volume: Page:
ISSN:
Container-title:2021 IEEE 15th International Conference on Electronic Measurement & Instruments (ICEMI)
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Author:

Xie Weikun,Nan Ziyuan,Gao Shi

Funder

Fundamental Research Funds for the Central Universities

National Key R&D Program of China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9679477/9679471/09679613.pdf?arnumber=9679613

Reference15 articles.

1. A Method for Run-Time Prediction of On-Chip Thermal Conditions in Dynamically Reconfigurable SOPCs

2. On‐Chip Generating FPGA Test Configuration Bitstreams to Reduce Manufacturing Test Time

3. Built-in Self-Test Design for Fault Detection and Fault Diagnosis in SRAM-Based FPGA[J];hsu;IEEE Transaction on Instrumentation and Measurement,2009

4. Design of Interconnection Networks for Programmable Logic

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