An Integrated Framework for Application Independent Testing of FPGA Interconnect

Author:

Banik ShuklaORCID,Roy Suchismita,Sen Bibhash

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Reference23 articles.

1. Banik S, Roy S, Sen B (2019) Test configuration generation for different FPGA architectures for application independent testing. In: Proc 32nd International conference on VLSI design (VLSID), pp 395–400

2. Barrett CW, Sebastiani R, Seshia SA, Tinelli C (2009) Satisfiability modulo theories. Handbook Satisfiab 185:825–885

3. de Moura L, Bjørner N (2012) Z3 - a tutorial. Technical report, Microsoft

4. Dixon B, Stroud C, Nelson V (2009) System-level built-in self-test of global routing resources in virtex-4 FPGAs. In: Proc 41st Southeastern symposium on system theory, pp 29–32

5. Hsu CL, Chen TH (2009) Built-in self-test design for fault detection and fault diagnosis in sram-based FPGA. IEEE Trans Instrum Meas 58(7):2300–2315

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