Enhanced Metalorganic Chemical Vapor Deposition Titanium Nitride Film Fabricated Using Tetrakis-Dimethylamino-Titanium for Barrier Metal Application in Sub-Half-Micron Technology
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Study on plasma assisted metal-organic chemical vapor deposition of Zr(C,N) and Ti(C,N) thin films andin situplasma diagnostics with optical emission spectroscopy;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2008-07
2. Characteristics and Compositional Variation of TiN Films Deposited by Remote PEALD on Contact Holes;Journal of The Electrochemical Society;2005
3. Growth of Hf(C,N) thin films on Si(100) and D2 steel substrates by plasma assisted MOCVD;Surface and Coatings Technology;2000-09
4. Effects of Barrier-Metal Schemes of Tungsten Plugs and Blanket Film Deposition;Japanese Journal of Applied Physics;2000-08-15
5. Adsorption and desorption kinetics of tetrakis(dimethylamino)titanium and dimethylamine on TiN surfaces;Applied Surface Science;1999-01
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