Author:
Watamori Michio,Oura Kenjiro,Shoji Fumiya,Yotsuya Tsutomu,Ogawa Soichi,Hanawa Teruo
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by
13 articles.
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1. Oxygen depth profiling in prepared by sol-gel method using 16O(α, α)16O resonant backscattering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-03
2. Channeling analysis of oxygen in oxide materials using 16O(α, α)16O resonant backscattering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-09
3. Backscattering analysis of thin SiO2 films on Si using 16O(α,α)16O 3.045 MeV resonance;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-09
4. Quantitative depth profiling of oxygen in homoepitaxial SrTiO3 films;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1995-05
5. Methodology for Accurate Oxygen Distribution Analysis and Its Application toYBa2Cu3OxThin Films Using16O(α, α)16O3.045 MeV Resonance Reaction;Japanese Journal of Applied Physics;1994-10-15