Author:
Watamori Michio,Oura Kenjiro,Hirao Takashi,Sasabe Kaoru
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Damage accumulation and annealing behavior in high fluence implanted MgZnO;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2012-02
2. Scattering methods;Instrumental Multi-Element Chemical Analysis;1998
3. High-energy ion beam analysis of ferroelectric thin films;Applied Surface Science;1997-06
4. Channeling analysis of oxygen in oxide materials using 16O(α, α)16O resonant backscattering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-09